FUNCTIONS: Automatic multi-scanning of 40 pins (DMX-240) & 80 pins (DMX-280) or scanning of each pin manually
Full compatibility with the DCD-XXX series
Auto stop on detection of fault point
High speed scanning FEATURES: Designed conveniently to use
Same design with the DCD-XXX series
Mode display
Light weight design and very portable
DCD-200
FUNCTIONS: Circuit debugging
Open and short testing
Impedance and wave form testing
CMOS, TTL & IC's wave form testing
LSI & ASIC's wave form testing
Comparison testing
Other forms of electronic and electrical component testing FEATURES:
Display two wave forms simultaneously
Designed conveniently to use
Industrial design makes the equipment very portable
Light weight
Difference mode (check difference between ch A and ch B)
240/DMX-280
FUNCTIONS:
Circuit debugging
Open and short testing
Impedance and wave form testing
CMOS, TTL & IC's wave form testing
LSI & ASIC's wave form testing
Comparison testing
Other forms of electronic and electrical component testing
DISPLAY SCOPE:
Built into the equipment
X, Y gain controls
X, Y display position controls
B channel position adjustment
Dual channel calibration scaling
Intensity & focus adjustment
Oscilloscope connection option